Schleuniger - MicroGraph System
SCHLEUN-40001015
Schleuniger’s MicroGraph System allows the creation of high-quality crimp cross-sectional images in a fraction of the time needed with “conventional” methods. The system is comprised of modular components that can be combined according to your individual needs.
Schleuniger - MicroGraph System
SCHLEUN-40001015
Schleuniger’s MicroGraph System allows the creation of high-quality crimp cross-sectional images in a fraction of the time needed with “conventional” methods. The system is comprised of modular components that can be combined according to your individual needs.
Need assistance, installation and/or training?
Call +32 (0)14 42 44 01 or contact us
Description
Crimp cross-sectional analysis has quickly become an integral part of the crimp quality process. With the MicroGraph System (MGS), crimp cross-sectional images can be created in a fraction of the time compared to conventional methods.
The combined sawing-polishing process, innovative electrolyte staining process, and high precision optics result in high quality images for thorough analysis of the connection. Electrical connections (e.g. crimped, welded, soldered or spliced) can be cut (sawed), polished, stained (cleaned), and visually analyzed.
The system includes modular components that can be combined according to individual needs. Ergonomically designed work tables are also available to optimize workflow when combining the components in one area. The complete system can also be integrated into mobile carts to create a mobile quality station.
Specifications
Features | MicroGraph System (MGS) + SawPolish Unit (SPU) + MacroZoom Unit 1.3 (MZU) + ElectrolyteStaining Unit (ESU) |
Downloads
Crimp cross-sectional analysis has quickly become an integral part of the crimp quality process. With the MicroGraph System (MGS), crimp cross-sectional images can be created in a fraction of the time compared to conventional methods.
The combined sawing-polishing process, innovative electrolyte staining process, and high precision optics result in high quality images for thorough analysis of the connection. Electrical connections (e.g. crimped, welded, soldered or spliced) can be cut (sawed), polished, stained (cleaned), and visually analyzed.
The system includes modular components that can be combined according to individual needs. Ergonomically designed work tables are also available to optimize workflow when combining the components in one area. The complete system can also be integrated into mobile carts to create a mobile quality station.
Type | Micrograph Laboratories |
---|